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TOC Alert for Publication# 19 2016June 27<![CDATA[Table of contents]]>657C11517228<![CDATA[IEEE Transactions on Instrumentation and Measurement publication information]]>657C2C2169<![CDATA[Maximizing Localization Accuracy via Self-Configurable Ultrasonic Sensor Grouping Using Genetic Approach]]>657151815293072<![CDATA[A Delta–Sigma Modulator for Low-Power Analog Front Ends in Biomedical Instrumentation]]>657153015394196<![CDATA[Measuring the Noise Cumulative Distribution Function Using Quantized Data]]>657154015461023<![CDATA[Probability Density Functions of Stationary Surface EMG Signals in Noisy Environments]]>1 and KR_{2}). The results show that at low SNR (<;5 dB), all noise types affect the statistical descriptors for the pdf of a noisy EMG signal. In addition, KR_{2} performs the best among these descriptors in identifying a noisy EMG signal from its pdf, because it is computed based on the quantiles of the data. As a result, it can avoid the effects of outliers resulting in the correct identification of pdf shape of noisy EMGs with all contamination types and all levels of SNR.]]>657154715572143<![CDATA[Perfectly Flat-Top and Equiripple Flat-Top Cosine Windows]]>657155815673597<![CDATA[Improved-Speed Parameter Tuning of Deconvolution Algorithm]]>657156815761244<![CDATA[Modular Software-Defined Radio Testbed for Rapid Prototyping of Localization Algorithms]]>657157715842261<![CDATA[Hardware Implementation of Polyphase-Decomposition-Based Wavelet Filters for Power System Harmonics Estimation]]>657158515954159<![CDATA[A New Methodology for Tracking and Instantaneous Characterization of Voltage Variations]]>657159616042463<![CDATA[Uncertainty Evaluation of the Waveform Parameters of 1-kV Low-Impedance Impulse Voltage Calibrator]]>p, T_{1}, and T_{2}, can be calculated based on the parameters of the circuit elements and circuit principle of the calibrator. The uncertainties of the waveform parameters are always evaluated by Guide to the Expression of Uncertainty in Measurement (GUM) in previous publications. However, GUM exhibits some limitations when it is applied. In this paper, a 1-kV low-impedance impulse voltage calibrator (1.56 μs/60 μs) is developed. The values and uncertainties of U_{p}, T_{1}, and T_{2} are evaluated with another two new approaches, Monte Carlo method and random fuzzy variable (RFV). Particularly, the combination of several RFVs with both random and nonrandom effects is also discussed when RFV method is applied. The detailed process of each approach is presented and the results are compared.]]>657160516132671<![CDATA[A Method for Detecting Half-Broken Rotor Bar in Lightly Loaded Induction Motors Using Current]]>657161416252102<![CDATA[Status Self-Validation of Sensor Arrays Using Gray Forecasting Model and Bootstrap Method]]>657162616403645<![CDATA[Utilizing Spin-Down Transients for Vibration-Based Diagnostics of Resiliently Mounted Machines]]>657164116503875<![CDATA[600-A Test System for Aging Analysis of Automotive Li-Ion Cells With High Resolution and Wide Bandwidth]]>657165116605176<![CDATA[Single Sheet Tester With Variable Dimensions]]>657166116681659<![CDATA[Effect of Sample Preparation on Microwave Material Characterization by Loaded Waveguide Technique]]>11) and transmission (S_{21}) properties to calculate the sample's dielectric properties. As such, it is important that the sample be prepared carefully, as the dielectric property calculation assumes a perfect (ideal) sample geometry. However, in practice, samples are oftentimes prepared by hand, resulting in a distorted sample geometry. This paper presents a simulation and measurement study on a number of potential sample preparation errors and the effect of these errors on calculated dielectric properties. Finally, a statistical analysis (including mean, standard deviation, coefficient of variation, and confidence interval) was applied to provide a method by which calculated dielectric properties (even when imperfect samples are used) can be checked to ensure that proper accuracy of the results has been achieved.]]>657166916771955<![CDATA[Time-to-Digital Converter Using a Tuned-Delay Line Evaluated in 28-, 40-, and 45-nm FPGAs]]>657167816893730<![CDATA[A Four-Sector Conductance Method for Measuring and Characterizing Low-Velocity Oil–Water Two-Phase Flows]]>657169016972624<![CDATA[Development of a Hardware Platform for Detection of Milk Adulteration Based on Near-Infrared Diffuse Reflection]]>657169817062614<![CDATA[Low-Cost, High-Accuracy Method and Apparatus for Detecting Meat Spoilage]]>657170717152515<![CDATA[Design and Development of an Electro-Optic Type-Flow Transmitter Using Mach–Zehnder Interferometer]]>657171617231465<![CDATA[IEEE Transactions on Instrumentation and Measurement information for authors]]>65717241724112<![CDATA[IEEE Instrumentation and Measurement Society Information]]>657C3C3164<![CDATA[IEEE Transactions on Instrumentation and Measurement institutional listings]]>657C4C4271