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TOC Alert for Publication# 15 2018March 15<![CDATA[Table of contents]]>604C1C147<![CDATA[IEEE Electromagnetic Compatibility Society]]>604C2C256<![CDATA[Review of the Feature Selective Validation Method (FSV). Part II—Performance Analysis and Research Fronts]]>60410291035412<![CDATA[Introduction to the Special Issue for the 2017 IEEE International Symposium on EMC+SIPI]]>6041036103786<![CDATA[Wideband Noise Measurement Technique in Duplex Systems for RF Interference]]>60410381044884<![CDATA[Free-Space Antenna Factor Computation Using Time-Domain Gating and Deconvolution Filter for Site Validation of Fully Anechoic Rooms]]>604104510521617<![CDATA[An On-Chip Detector of Transient Stress Events]]>60410531060924<![CDATA[Worst-Case Crosstalk Measurements of Cables—The Multinetwork Analyzer Method]]>60410611068859<![CDATA[Evaluation and Improvement of the Reproducibility of CISPR 25 ALSE Test Method]]>604106910771522<![CDATA[Efficient Circuit and an EM Model of an Electrostatic Discharge Generator]]>604107810861879<![CDATA[SNR Analysis and Optimization in Near-Field Scanning and EMI Applications]]>604108710941020<![CDATA[Codesign of Electrostatic Discharge Protection Device and Common Mode Suppression Circuit on Printed Circuit Board]]>604109511011150<![CDATA[Investigating CM Voltage and Its Measurement for AC/DC Power Adapters to Meet Touchscreen Immunity Requirement]]>604110211101576<![CDATA[Numerical Conditional Probability Density Function and Its Application in Jitter Analysis]]>604111111201221<![CDATA[MoM-Based Ground Current Reconstruction in RFI Application]]>604112111281423<![CDATA[Software-Assisted Detection Methods for Secondary ESD Discharge During IEC 61000-4-2 Testing]]>dI/dt of the current waveform, and total charge delivered, which enable automatic detection of secondary ESD while monitoring the discharge waveform at the ESD gun tip.]]>604112911361817<![CDATA[A Method of Extracting the Effective Copper Surface Roughness of a PCB Laminate In Situ]]>in situ is introduced. The rough copper attenuation as a function of surface roughness is removed from the total attenuation. The residual loss is fit to coefficients, and an error is calculated based on the remaining apparent surface roughness contribution. When the error is minimized or when the apparent surface roughness contribution is nearest zero, the effective surface roughness is found, and the dielectric attenuation is isolated by subtracting the rough copper attenuation from the total attenuation. Using this value, accurate broadband permittivity values can be extracted by simply measuring the S-parameters of two stripline transmission lines. Further, the extracted dielectric electrical properties are calculated with a higher accuracy than the existing methods that neglect copper surface roughness. A supplementing method to unwrap the phase constant is also included in this work to avoid errors do to the length of the devices. Previous methods of extracting laminate material properties that consider copper surface roughness rely on cutting the sample to make a cross-section and observe the surface roughness directly. In this work, the effective surface roughness is gathered without destroying the sample.]]>604113711461941<![CDATA[Advances in lightning modeling, computation and measurement]]>60411471147117<![CDATA[Introducing IEEE Collabratec]]>604114811481912<![CDATA[EMC Society Policy]]>604C3C3224<![CDATA[IEEE Transactions on Electromagnetic Compatibility institutional listings]]>604C4C4158