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Dealing with Issues in VLSI Interconnect Scaling

Ho, Ron  
Sponsored by: IEEE Solid-State Circuits Society
Presented at: International Solid-State Circuits Conference
Publication Date: Dec-2008
ISBN: 1-4244-1450-4
Run Time: 1:00:00

Price: US $69.95   »   Buy Now

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Abstract
This course discusses on-chip wires, how to model them, what are their problems (and their advantages) and some solutions. Topics that will be covered include: Wire characteristics and how they determine performance; Wires under technology scaling; and Methods to improve wire performance.

Educational Course Subject Areas
Circuits & DevicesComputing

Keywords
wirewire resistancewire capacitancewire inductancepartial inductanceLow-K dielectricsFanout-of-four inverter delay (FO4)elmore delayrepeaterslocal wiresglobal wirestransmission linesequalization


 
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