Abstract
Variability is a reality in nanometer semiconductor processes. This course will cover the sources of systematic and random variations of transistors and their surrounding interconnects. Included in the variability discussion will be withinchip variability, across-wafer variability, across-device variability, and device mismatch. The resulting impact upon an individual circuit’s functionality and timing will be explored. Analytical approaches will be shown for examining the variability’s impact upon leakage power, dynamic power, and circuit functionality of static and dynamic circuits, SRAM arrays, and PLLs. Techniques will include Monte-Carlo analysis, vector analysis, and statistical timing analysis.

Educational Course Subject Areas
Circuits & Devices

Keywords
Beta Ratio ,  Line Edge Roughness ,  Monte Carlo ,  NBTI ,  Negative Bias Temperature ,  Instability ,  Random dopant fluctuation ,  Random Variation ,  Systematic Variation ,  Temporal Variation ,  Worst Case Vector ,  Analysis