Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
IEEE Educational Courses
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_left Back to Browse     
» New Course Offerings

Integrated Circuit Digital Design Methodology
Sheppard ,Douglas  

Integrated Circuit Digital Design Methodology: Advanced Analysis and Simulation
Sheppard, Douglas  

SRAM Design: Overview and Memory Cell Design
Sheppard, Douglas  

SRAM Design - Sensing Scheme
Sheppard, Douglas  

SRAM Design - Array Design and Precharge
Sheppard, Douglas  


» Learn More About
Educational Courses
For Individuals
Institutional Subscriptions
  
 

Solid-State Lighting

Schubert, E. Fred  
Sponsored by: IEEE Lasers & Electro-Optics Society
Presented at: Conference on Lasers & Electro-Optics (CLEO)
Publication Date: Nov-2005
ISBN: 0-7803-9644-8
Run Time: 1:55:00

Price: US $69.95   »   Buy Now

Access Course

Abstract
This course presents an introduction as well as reference materials for professionals working in solid-state lighting. Course materials include the operating principles, device physics, fabrication, and applications of light-emitting diodes. Course materials also include a detailed discussion of daylight illumination sources, planckian sources, human vision, eye sensitivity, photometric and radiometric quantities, and color rendering capabilities of light sources. After completing this course you should be able to develop and understanding of: The operating principles of light-emitting diodes; The principles of human vision, planckian sources, photometric and radiometric quantities, color rendering, and the color-rendering index; Areas for present and future applications of solid-state lighting devices.

Educational Course Subject Areas
Lasers & Optics

Keywords
chip shapingexternal quantum efficiencyextraction efficiencyinternal quantum efficiencyluminous efficacy of radiationluminous efficiency of a sourcePlanckian radiatorpower efficiencyradiometric unitswavelength converter


 
arrow_left Back to Browse  
Indexed by IEE Inspec
© Copyright 2009 IEEE – All Rights Reserved