Built-In Current Monitor for IDDQ Testing in CMOS 90 nm Technology

In this paper, a built-in current (BIC) monitor for testing low-voltage digital CMOS circuits is presented. The monitor is designated for typical I
_DDQ
testing as well as for characterization of supply current values for different test vectors. Voltage drop across the monitor during measurement and the switching phase are minimized. A wide range of currents is supported. Abilities and limitations of the BIC monitor were verified through simulations. Results of post layout simulations are presented as well. The design was implemented in UMC CMOS 90 nm technology.