Coherent nonlinear response from excitation induced shift in semiconductors

Summary form only given. An excitation induced shift (EIS) can result in a contribution to the transient four-wave-mixing (TFWM) signal. Experimentally, we detect the presence of EIS by spectrally resolving the TFWM signal from a strained InGaAs/GaAsP multiple quantum well. The strain increases the heavy-hole-light-hole splitting so that only the heavy hole exciton plus continuum is excited by the incident pulses.