Single event transients of scan flip-flop and an SET-immune redundant delay filter (RDF)

Heavy-ion tests on 65nm CMOS Flip-Flops with different topologies are conducted to investigate their susceptibility to single event upsets (SEUs) and single event transients (SETs). The test results show that SETs on scan-enable node (SE) may cause a large number of SEUs, and the conventional delay filter is vulnerable to SETs, which can reduce the efficiency of delay-filter Flip-Flops. A new delay filter named redundant delay filter (RDF) is proposed to improve the SET immunity.