A New Methodology to Build the Internal Activity Block of ICEM-CE for Complex Integrated Circuits

End-users of integrated circuits need models to anticipate and solve conducted emission issues at board level in a short time. The standard IEC62433-2 integrated circuit emission model-conducted emissions (ICEM-CE) has been proposed to respond to this demand. Although the standard proposes methods to extract circuit models from measurements, they cannot provide activity-dependent models and may lead to inaccurate results for large and complex circuits. This paper describes a new methodology of construction of the internal activity block of an ICEM-CE model adapted to large digital integrated circuits and validated on a field-programmable gate array. The method is based on a predictive approach using the estimation tools of the dynamic power and the data path delays proposed by the manufacturer of the integrated circuit.