Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Login
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
Article Information

On the utility of the circular ring model for wideband MIMO channels [mobile fading channels]
Latinovic, Z.; Abdi, A.; Bar-Ness, Y.
Vehicular Technology Conference, 2004. VTC2004-Fall. 2004 IEEE 60th
Volume 1, Issue , 26-29 Sept. 2004 Page(s): 96 - 100 Vol. 1
Digital Object Identifier   10.1109/VETECF.2004.1399934
Summary: In this paper, we use the circular ring scattering model to derive the signal statistics of a wideband MIMO channel. Based on the proposed model, a new space-time-frequency (STF) cross-correlation function is derived for the MIMO channel. The cross-correlation includes various parameters of interest such as the distance between the base station and the user, spacing among antenna elements, user's speed and direction, as well as the angle spread and delay spread. In addition, the important channel properties such as the time of arrival probability density function (PDF) and power delay profile as well as the angle of arrival PDF and power azimuth spectrum are derived and compared with measured data. The proposed model and associated wideband STF cross-correlation provide a convenient unified framework for the characterization and simulation of frequency selective mobile MIMO fading channels and the design of proper STF codes and signaling techniques over such channels.

» View citation and abstract

IEEE Members

Log in by entering your IEEE Web Account Username and Password.

IEEE Communications Society members: If you subscribe to the IEEE Electronic Periodicals Package or IEEE Electronic Periodicals Package Plus, you must access your subscription at www.comsoc.org.

Users at Subscribing Institutions

Check with your librarian, information professional, or system manager to determine if you need to log in. Please complete the online Technical Support Form if you need assistance.

Already Purchased This Article?

Select the Purchase History link to access the document. You will have 5 Days after purchase to access the Full Text PDF. Please complete the online Technical Support Form if you need assistance.

Guests

• Search and access Abstract records free of charge
Register for table of contents alerts
• Purchase Full Text PDF documents

» Learn more about subscription options or how to become an IEEE Member.

You are not logged in.
LOGIN
Username
Password
GO
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
» Buy this document now
» Learn more about
» Learn more about
   purchasing articles
   and standards
Learn more about IEEE Subscriptions
Indexed by IEE Inspec
© Copyright 2008 IEEE – All Rights Reserved