Measurement of the dielectrics using the near-field microwave microscope

A technique for measurement of the dielectric constant of materials is submitted. For this purpose, a near-field microwave microscope (NFMM) was used. A piece of coaxial wave guide was applied, with the internal conductor acting as a probe, and also a build-up of its possible mathematical model is discussed. The offered measurement technique allows significant simplification of the sample manufacturing requirements, concerning its size and form. Thus, the measurement error becomes a fraction of a percent when a standard circuit analyzer such as the P2-65 is used. By using the microwave frequency meter, measurement accuracy will increase. Besides, the use of the NFMM allows carrying out the control of a sample's uniformity with high resolution.