Knowledge Management Capability Assessment: Validating a Knowledge Assets Measurement Instrument
Freeze, R.; Kulkarni, U.
System Sciences, 2005. HICSS apos;05. Proceedings of the 38th Annual Hawaii International Conference on
Volume , Issue , 03-06 Jan. 2005 Page(s): 251a - 251a
Digital Object Identifier   10.1109/HICSS.2005.375
Summary: Measurement of organizational knowledge assets is necessary to determine the effectiveness of knowledge management initiatives. A Knowledge Management Capability Assessment instrument has been developed and operationalized to measure knowledge assets identified as Knowledge Capability Areas. A longitudinal field study is initiated in a large microchip manufacturing company to determine the reliability and validity of the KMCA and to assess the success of KM initiatives. In this paper, we provide the initial validation of the KMCA with empirical evidence from two business units of the company. Confirmatory factor analysis revealed that four Knowledge Capability Areas can be conceptualized in terms of latent descriptor variables. Each capability area is identified as an overall latent factor influencing a set of latent descriptor variables. Second Order and General-Specific structural equation models of each capability area provide evidence of the validity of measurement of these knowledge assets.

» View citation and abstract

Log in by entering your IEEE Web Account Username and Password.

IEEE Communications Society members: If you subscribe to the IEEE Electronic Periodicals Package or IEEE Electronic Periodicals Package Plus, you must access your subscription at www.comsoc.org.

Check with your librarian, information professional, or system manager to determine if you need to log in. Please complete the online Technical Support Form if you need assistance.

Select the Purchase History link to access the document. You will have 5 Days after purchase to access the Full Text PDF. Please complete the online Technical Support Form if you need assistance.

• Search and access Abstract records free of charge
• Register for table of contents alerts
• Purchase Full Text PDF documents

» Learn more about subscription options or how to become an IEEE Member.