Lifetime predictions due to electromigration failure in tape heads

In this paper, we have analyzed accelerated testing on thin film AMR tape recording heads in order to estimate their mean-time-to-finite under operating conditions were far from the operating conditions. The datas were analyzed in different techniques. The results generally predicted a mean time to failure on the order of 10/sup 7/. However, it is clear electromigration not be measurable contributor to heads failure in this product.