Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Login
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
Article Information

HTS SQUID microscope head with sharp permalloy rod for high spatialresolution
Nagaishi, T.; Minamimura, K.; Itozaki, H.
Applied Superconductivity, IEEE Transactions on
Volume 11, Issue 1, Mar 2001 Page(s):226 - 229
Digital Object Identifier   10.1109/77.919325
Summary:Spatial resolution with a sharp permalloy rod on an HTS SQUID microscope head was investigated. A 5 mm diameter and 10 mm long permalloy rod with one side sharp and one side flat is placed In front of a washer type SQUID with 0.1 mm spacing. A 0.3 mm line and space meander line on a printed circuit board carrying current was used as a magnetic field source. The SQUID microscope head with the sharp permalloy rod scanned two dimensionally on the meander line inside the magnetic shield. The 0.3 mm line and space meander line was resolved. We also demonstrated imaging of laser-printed characters. This method has the advantage of using a washer type SQUID with high magnetic sensitivity, high spatial resolution and facilitating the adjustment of the position and the measurement distance from the sample

» View citation and abstract

IEEE Members

Log in by entering your IEEE Web Account Username and Password.

IEEE Communications Society members: If you subscribe to the IEEE Electronic Periodicals Package or IEEE Electronic Periodicals Package Plus, you must access your subscription at www.comsoc.org.

Users at Subscribing Institutions

Check with your librarian, information professional, or system manager to determine if you need to log in. Please complete the online Technical Support Form if you need assistance.

Already Purchased This Article?

Select the Purchase History link to access the document. You will have 5 Days after purchase to access the Full Text PDF. Please complete the online Technical Support Form if you need assistance.

Guests

• Search and access Abstract records free of charge
Register for table of contents alerts
• Purchase Full Text PDF documents

» Learn more about subscription options or how to become an IEEE Member.

You are not logged in.
LOGIN
Username
Password
GO
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
» Buy this document now
» Learn more about
» Learn more about
   purchasing articles
   and standards
Learn more about IEEE Subscriptions
Indexed by IEE Inspec
© Copyright 2008 IEEE – All Rights Reserved