Measurement of the absolute penetration depth and surfaceresistance of superconductors using the variable spacing parallel plateresonator
Talanov, V.V.; Mercaldo, L.V.; Anlage, S.M.
Applied Superconductivity, IEEE Transactions on
Volume 9, Issue 2, Jun 1999 Page(s):2179 - 2182
Digital Object Identifier   10.1109/77.784900
Summary:We have developed a modified Parallel Plate Transmission Line Resonator with a smoothly variable thickness of the dielectric spacer filled by liquid nitrogen. A cryogenic linear stage is made to vary the spacer from 200 μm down to contact with 0.1 μm resolution. Estimates of the absolute penetration depth and the surface resistance are based on the analysis of the spacer thickness dependencies of the resonator frequency and Q-factor. The measurements are performed at fixed temperature (77 K), so the result does not depend on an a priori model for the temperature dependence of the penetration depth. The ability of this technique to be employed as a standard for characterization of HTS films for microwave applications is pointed out

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