Implantation effects of ultra-thin Fe/Cr multilayers

The magnetic and structural properties of ultra-thin Fe/Cr multilayers (MLs) after ion implantation by 150 keV Cr and Fe ions have been investigated using a vibrating sample magnetometer (VSM) and a conversion electron Mossbauer spectroscopy (CEMS) to clarify a relation among the magnetization, giant magnetoresistance (GMR) properties and the interface structure. We have shown that the ion implantation induces the degradation of the interface structure resulting in a break of antiferromagnetic coupling and a decrease of magnetization, which correspond to the change of GMR properties.