Study of easy axis orientation measurement of magnetic films for mr heads

Easy axis orientation(EAO) of the MR film is one of the essential parameters related with the asymmetry of readout waveforms of MR heads. Therefore, the measurement of EA0 within the substrate is important for increasing the yields of MR head production. The EA0 mapping system[l] have already been presented and the system detected the switching of the film magnetization applying rotating magnetic field. Using similar commercial EA0 mapping system, we found the limit of EA0 values by comparing the calculated and measured EA0 curves. We applied the measurement for MR film and analyzed the reason of EA0 dispersion.