The influence of the substrate temperature during the pulse laser deposition on the YBCO thin films revealed by AFM

The results obtained by atomic force microscopy (AFM) characterisation of high temperature superconducting (HTS) YBCO thin films, pulse laser deposited (PLD) on a heated LaAlO/sub 3/ substrate, are presented. An KrF excimer laser beam was used for the thin film PLD (ablation) in reactive vacuum. The analysed thin films were grown on the same substrate which, because of the glue, was at different thermal conditions. It was found that the film with a slightly lower substrate temperature has not completely switched to the orthorhombic structure and the electrical characteristics of the two thin films are significantly different.