Designing Built-In Test for Microprocessors

This paper provides the BIT (Built-In-Test) designer with a generalized test strategy for testing microprocessors (Mp). The basic microprocessor BIT tests are defined including methods of modifying these tests to a specific microprocessor. The test hardware and software, which supports the individual tests, are described along with an example of its implementation. Some design options and tradeoffs are made available to allow flexibility for diversified application. An example of this strategy using INTEL's 8086 microprocessor is provided.