Snapback device studies using multilevel TLP and multi-impedance TLP testers

Standard 50-ohm TDR TLP systems do not accurately measure the clamp voltage and minimum holding currents of snapback ESD protection structures. Two methods are presented that can accurately determine device operation at the turn-on point. Multilevel TLP generated with charge lines is contrasted with 100-to-1000-ohm TDRT for snapback parameter determination.