Growth of high crystalline quality CdTe layers on 100 mm diameter Ge substrates for room temperature radiation detection

Uniform layers of cadmium telluride have been successfully grown hetero-epitaxially on germanium seeds up to 100 mm in diameter. X-ray diffraction studies show high structural quality for layers up to 1.4 mm thick. By doping with chlorine, resistivities up to 1 × 10
⁹
Ωcm have been achieved.