Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Login
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
Article Information

Diversity combining with imperfect channel estimation
You, R.; Hong Li; Bar-Ness, Y.
Communications, IEEE Transactions on
Volume 53, Issue 10, Oct. 2005 Page(s): 1655 - 1662
Digital Object Identifier   10.1109/TCOMM.2005.857156
Summary: The optimal diversity-combining technique is investigated for a multipath Rayleigh fading channel with imperfect channel state information at the receiver. Applying minimum mean-square error channel estimation, the channel state can be decomposed into the channel estimator spanned by channel observation, and the estimation error orthogonal to channel observation. The optimal combining weight is obtained from the first principle of maximum a posteriori detection, taking into consideration the imperfect channel estimation. The bit-error performance using the optimal diversity combining is derived and compared with that of the suboptimal application of maximal ratio combining. Numerical results are presented for specific channel models and estimation methods to illustrate the combined effect of channel estimation and detection on bit-error rate performance.

» View citation and abstract

IEEE Members

Log in by entering your IEEE Web Account Username and Password.

IEEE Communications Society members: If you subscribe to the IEEE Electronic Periodicals Package or IEEE Electronic Periodicals Package Plus, you must access your subscription at www.comsoc.org.

Users at Subscribing Institutions

Check with your librarian, information professional, or system manager to determine if you need to log in. Please complete the online Technical Support Form if you need assistance.

Already Purchased This Article?

Select the Purchase History link to access the document. You will have 5 Days after purchase to access the Full Text PDF. Please complete the online Technical Support Form if you need assistance.

Guests

• Search and access Abstract records free of charge
Register for table of contents alerts
• Purchase Full Text PDF documents

» Learn more about subscription options or how to become an IEEE Member.

You are not logged in.
LOGIN
Username
Password
GO
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
» Buy this document now
» Learn more about
» Learn more about
   purchasing articles
   and standards
Learn more about IEEE Subscriptions
Indexed by IEE Inspec
© Copyright 2008 IEEE – All Rights Reserved