Robust system design with built-in soft-error resilience
Mitra, S.; Seifert, N.; Zhang, M.; Shi, Q.; Kim, K.S.
Computer
Volume 38, Issue 2, Feb. 2005 Page(s): 43 - 52
Digital Object Identifier   10.1109/MC.2005.70
Summary: Transient errors caused by terrestrial radiation pose a major barrier to robust system design. A system's susceptibility to such errors increases in advanced technologies, making the incorporation of effective protection mechanisms into chip designs essential. A new design paradigm reuses design-for-testability and debug resources to eliminate such errors.

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