Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Login
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
Article Information

Combining Visualization and Statistical Analysis to Improve Operator Confidence and Efficiency for Failure Detection and Localization
Bodik, P.; Friedman, G.; Biewald, L.; Levine, H.; Candea, G.; Patel, K.; Tolle, G.; Hui, J.; Fox, A.; Jordan, M.I.; Patterson, D.
Autonomic Computing, 2005. ICAC 2005. Proceedings. Second International Conference on
Volume , Issue , 13-16 June 2005 Page(s):89 - 100
Digital Object Identifier   10.1109/ICAC.2005.18
Summary:Web applications suffer from software and configuration faults that lower their availability. Recovering from failure is dominated by the time interval between when these faults appear and when they are detected by site operators. We introduce a set of tools that augment the ability of operators to perceive the presence of failure: an automatic anomaly detector scours HTTP access logs to find changes in user behavior that are indicative of site failures, and a visualizer helps operators rapidly detect and diagnose problems. Visualization addresses a key question of autonomic computing of how to win operators' confidence so that new tools will be embraced. Evaluation performed using HTTP logs from Ebates.com demonstrates that these tools can enhance the detection of failure as well as shorten detection time. Our approach is application-generic and can be applied to any Web application without the need for instrumentation

» View citation and abstract

IEEE Members

Log in by entering your IEEE Web Account Username and Password.

IEEE Communications Society members: If you subscribe to the IEEE Electronic Periodicals Package or IEEE Electronic Periodicals Package Plus, you must access your subscription at www.comsoc.org.

Users at Subscribing Institutions

Check with your librarian, information professional, or system manager to determine if you need to log in. Please complete the online Technical Support Form if you need assistance.

Already Purchased This Article?

Select the Purchase History link to access the document. You will have 5 Days after purchase to access the Full Text PDF. Please complete the online Technical Support Form if you need assistance.

Guests

• Search and access Abstract records free of charge
Register for table of contents alerts
• Purchase Full Text PDF documents

» Learn more about subscription options or how to become an IEEE Member.

You are not logged in.
LOGIN
Username
Password
GO
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
» Buy this document now
» Learn more about
» Learn more about
   purchasing articles
   and standards
Learn more about IEEE Subscriptions
Indexed by IEE Inspec
© Copyright 2008 IEEE – All Rights Reserved