Nondestructive measurement of dielectric materials using photocharge voltage

The photocharge voltage is observed for dielectric materials. This voltage appears on any solid body when light is irradiated on a sample. The potential difference is observed on various materials such as conductors, semiconductors, dielectrics, and ceramics. For dielectric materials, the magnitude of the voltage is of the order of /spl mu/V. The purpose of this paper is to report the purely experimental photocharge voltage measurements for dielectric materials, including two dimensional scan of LiNbO/sub 3/ wafer, and the test structure. The photocharge voltage was generated by chopped laser and halogen lamp light.