Industrial relevance of analog IFA: a fact or a fiction

Inductive Fault Analysis (IFA) for analog circuits has received considerable attention in recent years. IFA can be exploited for simplifying various aspects of analog testing. It can also be exploited towards design robustness against process defects, fault grading of a design and examining practicality of analog DfT schemes. In this article, we analyse both aspects of analog IFA with real life examples. Towards the test side, the simulated as well as silicon data demonstrate the strengths of IFA based test methods in test cost reduction and structural test generation. However, some of the escaped devices suggest partial specification testing along with IFA based test is desirable from a quality as well as economic point of view. Towards the design side, the simulation results highlight macros where DfT is needed most and help in determination of effective DfT schemes.