An experimental approach to analog fault models

A comprehensive approach to model faults in analog circuits and systems based on experimental statistics of manufacturing defects is presented. A case study based on a simple sample-and-hold circuit is discussed with specific results. It is shown that the digital fault models are applicable to analog and mixed-signal circuits but they account only for catastrophic faults. Out-of-specification faults occur as often as catastrophic faults and must be addressed in any DFT (discrete Fourier transform) technique or test generation algorithm.<
>