Stress induced frequency shift of dielectric resonators with magnetic wall

This paper presents a perturbation analysis on the stress or strain induced frequency shift through piezooptic or photoelastic effect in dielectric resonators with open circuit boundary or magnetic wall. Based on the availability of the frequency and mode when stress is not present, prediction on first order stress induced frequency shift is obtained for a resonator of arbitrary shape and with general dielectric permittivity tensor. The result is in fact also valid for resonators with short circuit boundary or electric wall, or resonators with partial open circuit boundary and partial short circuit boundary.<
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