Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Login
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
Article Information

Tolerating sensor timing faults in highly responsive hard real-timesystems
Poledna, S.
Computers, IEEE Transactions on
Volume 44, Issue 2, Feb 1995 Page(s):181 - 191
Digital Object Identifier   10.1109/12.364530
Summary:Real-time systems that have to respond to environmental state changes within a very short latency period often use event-triggered task activation. If the system has to function correctly in the presence of sensor faults, event-triggered task activation is not reliable. Faulty sensors may cause task activations to occur too early, too late, or task activations are omitted entirely. In particular, early task activations can overload the system. Time-triggered task activation is reliable, but by defining a competitiveness ratio it is shown that the processor utilization for highly responsive tasks is unacceptably low. To overcome the problems of event-triggered task activation while preserving its good performance the task-splitting model is introduced. The task-splitting model integrates fault tolerance into the analysis and construction of hard real-time systems by using a combination of event-triggered and time-triggered task activation. Based on a general task model, it is independent of any particular scheduling algorithm. The result of this work has influenced the design of a new operating system which will be applied in a robust automotive engine controller of the next generation

» View citation and abstract

IEEE Members

Log in by entering your IEEE Web Account Username and Password.

IEEE Communications Society members: If you subscribe to the IEEE Electronic Periodicals Package or IEEE Electronic Periodicals Package Plus, you must access your subscription at www.comsoc.org.

Users at Subscribing Institutions

Check with your librarian, information professional, or system manager to determine if you need to log in. Please complete the online Technical Support Form if you need assistance.

Already Purchased This Article?

Select the Purchase History link to access the document. You will have 5 Days after purchase to access the Full Text PDF. Please complete the online Technical Support Form if you need assistance.

Guests

• Search and access Abstract records free of charge
Register for table of contents alerts
• Purchase Full Text PDF documents

» Learn more about subscription options or how to become an IEEE Member.

You are not logged in.
LOGIN
Username
Password
GO
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
» Buy this document now
» Learn more about
» Learn more about
   purchasing articles
   and standards
Learn more about IEEE Subscriptions
Indexed by IEE Inspec
© Copyright 2008 IEEE – All Rights Reserved