Proceedings 2002 Design, Automation and Test in Europe Conference and Exhibition

The following topics are dealt with: semiconductor IP; formal verification; cooling; power management; defect oriented test; SAT and BDD techniques; low power design; mixed signal test; collaborative design; logic synthesis; symbolic techniques; EDA tools; analogue circuits; asynchronous circuits; BIST; DFT; co-design; SoC; embedded systems; reconfigurable architectures; analogue modelling; object oriented design; interconnect modelling; fault tolerance; ATPG; high-level synthesis; and IC modelling.