Degradation in Efficiency of InGaN/GaN Multiquantum Well Solar Cells With Rising Temperature

In this article, the authors theoretically and experimentally investigate the mechanism of degradation of InGaN/GaN multi-quantum well (MQW) solar cells. InGaN/GaN MQW solar cells with chips of size
$1\times1$
mm2 were fabricated and characterized within a range of temperature of 50 °C–250 °C to determine the effects of dislocations on their efficiency. The internal intensity of X-ray diffractions was used to construct a 2-D physical model of the density of edge dislocations in the InGaN/GaN MQW that was then simulated in Silvaco. The results show that the relative error in
$\eta $
between the simulation and the experiment was less than 5% over the examined range of temperature. This shows that an intensified number of nonradiative recombinations owing to high temperature contribute to edge dislocations that eventually degrade the performance of photoelectric devices. The work here provides a theoretical and experimental basis for the growth of high-quality InGaN materials to fabricate highly efficient solar cells.