Build-in-self-test of a real time digital signal processing system

A new method of built-in self-test of a real time digital signal processor is offered. This method is a hybrid one of board-level testing and system-level testing. It can integrate system adjustment, on-line testing and off-line testing in one BIST architecture. The implementation of the BIST is offered and the performance of the time domain processing test and frequency domain processing test are analysed.