Optimization of the temporal response of II-VI direct type semiconductor detectors for flat-panel pulsed X-ray imaging

The rising and falling edges of detected signal pulses have been measured utilizing X-ray ionization of a planar Cd/sub 1-x/Zn/sub x/Te system under different irradiation geometries, at different detector thicknesses, and applied electric fields. The experimental results of this study indicate that the time response of the CdZnTe based X-ray system is suitable for digital pulsed radiographic applications.