Sensitivity of R/sub s/-measurement of HTS thin films by three prime resonant techniques: cavity resonator, dielectric resonator, and microstrip resonator

The microwave surface resistance, R/sub s/ measurement of YBa/sub 2/Cu/sub 3/0/sub 7/ /sub -/spl delta// (YBCO) thin film deposited on 10 mm /spl times/ 10 mm LaAlO/sub 3/ substrate using three prime resonating techniques, namely, cavity end plate substitution technique (20 GHz), dielectric resonator technique (18 GHz), and microstrip resonator technique (5 GHz), is reported. In addition, theoretical analysis for each technique has been performed to calculate the relative percentage error in the measured R/sub s/ -value of the YBCO thin film as a function of temperature. It has been found that the shielded dielectric resonator provides far better sensitivity for R.-measurement of the YBCO thin film with minimum relative percentage error (<4%) in the temperature range from 20 K to transition temperature of YBCO thin film compared to the other two techniques.