Back to the future for integrated diagnostics (electronic military systems)

The integrated-diagnostics methodology to correcting high failure ambiguity rates seeks to provide an effective mix of diagnostic capabilities to improve fault detection and isolation. A certain measure of success has been obtained in the reduction of failure ambiguity; however, considerable improvements may be attained using built-in-monitoring equipment (BIME) or a visually oriented performance-analysis workstation (VOPAW). These concepts are discussed.<
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