Charging experiments on SiO/sub 2/ samples under electron irradiation

The charging of SiO/sub 2//glass samples under pulsed electron irradiation have been experimentally studied. More specifically, results about the secondary electron emission yield of the uncharged surface have been obtained and successfully compared to a semiempirical model. Moreover, we have pointed out a strong deviation of the evolution of the secondary emission yield (during a series of pulsed irradiation) compared to the theoretical expected one; these contradictory behaviors are explained by the influence of the trapped charges on the secondary electron emission from the charged sample surface.