A voltage controlled emission model of electromagnetic emission of IC for system analysis

In this contribution, a new modeling methodology for the electromagnetic emissions of integrated circuits for system analysis is presented. The developed models are based on a multipole expansion of the electromagnetic field. Using this macro-representation, the number of necessary model parameters can be drastically reduced. In order to account also for the influence of external circuitry, the models have been appropriately extended towards a voltage controlled emission model. To show the applicability of the new approach, a system-level simulator has been enhanced to use the developed models. The simulation results of a complex configuration are compared to reference calculations. Additionally, the high efficiency of this approach, concerning computation time and memory consumption, is described.