Design-in for EMC on CMOS large-scale integrated circuits

Meeting EMC demands is today and in future crucial to survive in the automotive, wireless and telecommunications market. This is valid not only for the system application level, but to a high grade already for semiconductor manufacturers. Testchips have been developed and evaluated at Infineon Technologies, reported previously by the author (2000). Research on signal integrity and RF noise decoupling inside the chips continues. This paper presents a set of design circuits and measures to improve EMC on silicon. The range is from RC low-pass noise filtering to improved I/O driver and clock distribution concepts. These measures have already been implemented in commercial products. Test results are shown from direct on-chip measurements and normative-compliant external emission measurements.