Guest Editorial: Special Section on Emerging Trends and Computing Paradigms for Testing, Reliability and Security in Future VLSI Systems

The papers in this special section focus on emerging trends and computing paradigms for testing, reliability and security in future VLSI systems. With the rapid advancement of computing technologies in all domains (i.e., handheld devices, autonomous vehicles, medical devices, and massive supercomputers), testability, reliability, and security of electronic systems are crucial challenges for the safety of human life. Emerging technologies coupled with new computing paradigms (e.g., approximate computing, neuromorphic computing, in-memory computing) are together exacerbating these problems posing significant challenges to researchers and designers. To address this increased complexity in the hardware testing, reliability, and security domains, engineers must employ design and analysis methods working at all levels of abstraction, starting from the system level down to the gate and transistor level.