Metrological automatic support in intelligent measurement systems

The main functions and properties of a metrological automatic support subsystem as a part of an intelligent measurement system are considered in this paper. The proposed hierarchy of the metrological automatic support's main procedures allows to use these procedures on different stages of sensor signal processing. Measurement result error calculation using MAS provides an evaluation of intelligent measurement channel characteristics. The interaction of the metrological automatic support subsystem and measurement system provides their functionalities both in parallel mode with the measurement procedures.