Built in self test for low cost testing of a 60MHz synchronous flash memory

Describes the application of a methodology of testing, based on an embedded built in self test (BIST) circuitry. Applying the described methodology to a standard flash memory with 60MHz burst read operation option, it is possible to obtain a maximum test coverage at package level, using a low cost automatic test equipment (ATE), with a speed of 20MHz only, commonly used for asynchronous flash memories. In addition, it is possible to extend the use of the BIST during the electrical wafer sort (EWS) test step. This makes possible speed classification at this level and helps to reduce the test time of each read operation, using 5mHz ATE.