Transmission measurements at 1.55 /spl mu/m on photonic-crystal ultrashort bend waveguides fabricated on InP based guiding layer

The wavelength dependent transmission through a double-60/spl deg/ bend waveguide defined in a two-dimensional photonic crystal (2D PC) is measured on an extended WDM range (1500-1590 nm). The fabrication of the photonic crystal into a GaInAsP confining layer on an InP substrate using CH4-based reactive ion etching (RIE) is also reported.