Characterization of wavelength-selective fiber-optic devices using a modified phase-shift method

We present a novel measurement setup that can be used for the complete characterization of fiber Bragg gratings and wavelength selective fiber-optic devices. Our setup is based on the phase-shift method (PSM), which we have modified to include the measurement of polarization-induced effects such as polarization-dependant loss (PDL) and polarization-mode dispersion (PMD). We measure the spectral response of devices used in transmission and in reflection, the wavelength dependency of the group delays due to chromatic and polarization-mode dispersion, and the wavelength dependency of the polarization-dependent loss. Experimental results are presented and sources of error are discussed. Comparisons with the Jones matrix eigenanalysis method for the measurement of PDL and differential group delay due to PMD have been carried out.