Large signal dielectric characterization measurement for integrated passive devices

Many of the existing methods of dielectric characterization measurement are based on small signal measurement. Through those methods, some important information, such as dielectric constant at different voltages, a critical concern for integrating passive modules, cannot be obtained. This paper presents a new method to measure dielectric characterization under resonant and constant current conditions for ranges up to 850 V and 10 A. With this circuit, the characteristics of dielectric materials under representative large signal renditions and time down to 1 /spl mu/s can be found.