Laser depth measurement using picosecond resolution time correlated single-photon counting

Summary form only given. In the last few years, depth profiling using a time-of-flight (TOF) system utilising the time-correlated single-photon counting has been successfully demonstrated. Previous work used the TOF system for very accurate scanning of surfaces at very short range (i.e. approximately 20 /spl mu/m depth resolution at 2 m). We have investigated the use of this technique for distance measurements.