Evaluation of accelerated total dose testing of linear bipolar circuits

Different part types of linear bipolar technology were irradiated in order to evaluate the ability of accelerated total dose testing to describe the tolerance at very low dose rate. On all tested types, the bias current was the most sensitive parameter. Results confirm that elevated temperature irradiation performed at high dose rate is well adapted to define the tolerance of the bias current at very low dose rate. The best accelerated test conditions correspond to a dose rate of 0.55 rad/s and irradiation temperature of 100/spl deg/C. However, such a procedure is not applicable to determine the behavior of the offset parameters at low dose rate.