A parallel built-in self-diagnostic method for embedded memory buffers

In this paper, we propose a new built-in self-diagnosis (BISD) method to simultaneously diagnose and repair spatially distributed memory modules with different sizes. Based on the serial interfacing technique, the serial fault masking effect is observed and a bi-directional serial interfacing technique is proposed to deal with such an issue. By tolerating redundant read/write operations, we develop a new march algorithm called DiagRSMarch to achieve the goals of low hardware overhead, tolerable diagnostic time, and high diagnostic coverage.