Testability features of the MDSP [Multimedia Fixed Point Digital Signal Processor]

In this paper, we describe the design-for-testability (DFT) features of the MDSP (Multimedia Fixed Point Digital Signal Processor) to guarantee high reliability. This chip performs digital signal processing for a portable multimedia function. The DFT feature includes full scan-design, BIST (Built-In-Self-Test) and IEEE 1149.1 (JTAG boundary scan).