An improved fault diagnosis algorithm based on path tracing with dynamic circuit extraction

We have proposed a fault diagnosis algorithm based on path tracing which dynamically extracts partial circuits and traces error propagation paths from failing primary outputs to a fault origin. Logic inference and the rating procedures are improved, so that various fault modes such as stuck-at, open and bridge faults can be diagnosed. We have shown that the improved technique localizes faults effectively in a reasonable time by applying it to several scan-based circuits: 20 K-gate benchmark circuits (ISCAS'89), and 100 K- and 2M-gate industrial circuits.