Facet reflectivity of antireflection-coated electroabsorption waveguide measured from photocurrent

Proposes a method to measure the low reflectivity of AR-coated EA waveguide facets by using the photocurrent. The Fabry-Perot interference effect is introduced in our method and the overall propagation loss and the facet reflectivity of EA waveguides are investigated from the photocurrent and reflectance on the front facet of the waveguide in the wavelength range from 1.54 /spl mu/m to 1.57 /spl mu/m. InGaAsP/InGaAsP multiple-quantum-well (MQW) EA waveguides were fabricated and cleaved with various cavity lengths. The propagation losses and cleaved facet reflectivity are determined from the contrast ratio in the photocurrent and reflectance spectra of the cleaved waveguide.